FACILITIES

(1) Integrated device fabrication system

 

• MBraun Glovebox with built-in

– Spin coater 

– Encapsulation system

– Solar simulator

– I-V characterization system

– In situ IPCE measurement

• Vacuum system with sample preparation chamber, evaporation chamber and sputtering chamber

(2) External quantum efficiency (IPCE) measurement, I-V characterization measurement

 

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(3) Others: 

– Transient photocurrent measurement

– Photo-CELIV measurements

– FET measurement system

– Device modeling

– Institute of Advanced Materials (IAM), HKBU: http://iam.hkbu.edu.hk/

– Surface Analysis & Material Characterization Laboratory (SML), HKBU: http://sml.hkbu.edu.hk/index.html